The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2020

Filed:

Jun. 30, 2017
Applicant:

Referentia Systems, Inc., Honolulu, HI (US);

Inventors:

Matthew Shawver, East Greenwich, RI (US);

Anthony Commendador, Honolulu, HI (US);

Wenyi Zhou, Honolulu, HI (US);

Assignee:

REFERENTIA SYSTEMS, INC., Honolulu, HI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/22 (2019.01); G06F 16/2455 (2019.01); G06F 16/2458 (2019.01);
U.S. Cl.
CPC ...
G06F 16/24553 (2019.01); G06F 16/22 (2019.01); G06F 16/2282 (2019.01); G06F 16/2474 (2019.01);
Abstract

In one aspect, there is provided a system configured to receive time series data collected by a first sensor. The time series data collected by the first sensor can be stored in a first data array associated with the first sensor. The first data array can stored proximate to a second data array that includes time series data collected by a second sensor. The first data array can be stored proximate to the second data array based on the first and second sensor being in a same sensor group. A query can be received to perform a processing algorithm on a subset of time series data. The subset can be generated by retrieving the first and second data array. The query can be executed by applying the processing algorithm to the subset of time series data. Related methods and articles of manufacture are also provided.


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