The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2020
Filed:
Feb. 09, 2017
Adobe Inc., San Jose, CA (US);
Shiv Kumar Saini, Bangalore, IN;
Trevor Paulsen, Lehi, UT (US);
Moumita Sinha, Bangalore, IN;
Gaurush Hiranandani, Karnataka, IN;
Adobe Inc., San Jose, CA (US);
Abstract
Techniques are disclosed for identifying anomalies in small data sets, by identifying anomalies using a Generalized Extreme Student Deviate test (GESD test). In an embodiment, a data set, such as business data or a website metric, is checked for skewness and, if found to be skewed, is transformed to a normal distribution (e.g., by applying a Box-Cox transformation). The data set is checked for presence of trends and, if a trend is found, has the trend removed (e.g., by running a linear regression). In one embodiment, a maximum number of anomalies is estimated for the data set, by applying an adjusted box plot to the data set. The data set and the estimated number of anomalies is run through a GESD test, and the test identifies anomalous data points in the data set, based on the provided estimated number of anomalies. In an embodiment, a confidence interval is generated for the identified anomalies.