The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2020
Filed:
Feb. 26, 2016
International Business Machines Corporation, Armonk, NY (US);
Nadiya Kochura, Bolton, MA (US);
Vinodkumar Raghavan, Westford, MA (US);
Donald H. Randall, Jr., Austin, TX (US);
Derek M. Reedy, Ayer, MA (US);
Timothy B. Snow, Westford, MA (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
A computer-implemented method is provided for determining quality metrics for a question set. In an implementation, a test question set model may be produced based upon calculated quality metrics of a test question set with respect to a test corpus, and including features representing quality metrics. The test question set model may be compared to a baseline question set model based on a distance calculated between one or more projected model features of the baseline question set model and one or more runtime model features of the test question set model. Contents of the test question set may be adjusted based upon the calculated distance.