The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2020
Filed:
Aug. 21, 2017
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventor:
Kazumi Kimura, Toda, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/12 (2006.01); G03G 15/043 (2006.01); H04N 1/113 (2006.01);
U.S. Cl.
CPC ...
G03G 15/0435 (2013.01); G02B 26/123 (2013.01); G02B 26/124 (2013.01); H04N 1/1135 (2013.01); H04N 2201/0094 (2013.01);
Abstract
An optical scanning device includes a deflector configured to deflect first and second beams to scan an effective area of a first scanned surface in a main scanning direction, and first and second imaging optical systems configured to guide the first and second beams deflected by the deflector to first and second areas, respectively, which are included in the effective area and different from each other in the main scanning direction. In the main scanning direction, the first area and the second area are asymmetric in width with respect to an optical axis.