The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2020

Filed:

Mar. 08, 2019
Applicant:

Dhpc Technologies, Inc., Woodbridge, NJ (US);

Inventors:

Yei Wo, East Brunswick, NJ (US);

Bruce P. Boczar, Trevose, PA (US);

Richard Gifford, Toms River, NJ (US);

Joseph M. Aletta, Jackson, NJ (US);

Assignee:

DHPC Technologies, Inc., Woodbridge, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03B 21/60 (2014.01); G03B 21/56 (2006.01); G02B 27/22 (2018.01); G03B 21/62 (2014.01); G03B 21/58 (2014.01);
U.S. Cl.
CPC ...
G03B 21/60 (2013.01); G02B 27/2221 (2013.01); G03B 21/56 (2013.01); G03B 21/58 (2013.01); G03B 21/62 (2013.01);
Abstract

A system, method, and device for simulating an emission signature, which contains representative intensity, temporal, and spectral emission profiles of a weapon system or weapon platform for the purpose of testing an optical detection device. A projection system optically projects the emission signature. A projection screen is provided that has a concave curvature. The concave curvature possesses a first focal point and a second focal point. Any light emanating from the second focal toward the projection screen is reflected by the projection screen toward the first focal point. The projection system is positioned at the second focal point and the optical detection system is positioned at the first focal point. In this manner, the emission signature projected by the projector system is redirected to the optical detection system.


Find Patent Forward Citations

Wo, Yei. (2020). System, method and device for a high fidelity electro-optical simulator (U.S. Patent No. 10527920). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10527920

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…