The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2020

Filed:

Feb. 27, 2017
Applicant:

Lockheed Martin Corporation, Bethesda, MD (US);

Inventors:

Jay Hansen, Bethesda, MD (US);

John B. Stetson, Jr., Bethesda, MD (US);

Michael DiMario, Bethesda, MD (US);

Assignee:

LOCKHEED MARTIN CORPORATION, Bethesda, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/08 (2006.01); G01R 33/00 (2006.01); G01R 33/02 (2006.01); G01R 33/022 (2006.01); G01V 3/16 (2006.01); G01D 5/14 (2006.01); G01R 33/032 (2006.01);
U.S. Cl.
CPC ...
G01V 3/081 (2013.01); G01D 5/14 (2013.01); G01R 33/00 (2013.01); G01R 33/02 (2013.01); G01R 33/022 (2013.01); G01V 3/16 (2013.01); G01R 33/032 (2013.01);
Abstract

A system includes a plurality of magnetometers that are each configured to generate a vector measurement of a magnetic field. The system also includes a central processing unit that is communicatively coupled to each of the magnetometers. The central processing unit is configured to receive from each of the plurality of magnetometers the respective vector measurement of the magnetic field. The central processing unit is further configured to compare each of the vector measurements to determine differences in the vector measurements and to determine, based on the differences in the vector measurements, that a magnetic object is near the plurality of magnetometers.


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