The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2020

Filed:

Mar. 15, 2017
Applicant:

Thinkware Corporation, Seongnam-si, Gyeonggi-do, KR;

Inventors:

Hye Sun Choi, Seongnam-si, KR;

Ki Wook Lee, Seongnam-si, KR;

Hye Kyung Byun, Seongnam-si, KR;

Assignee:

THINKWARE CORPORATION, Seongnam-si, KR;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01S 19/48 (2010.01);
U.S. Cl.
CPC ...
G01S 19/48 (2013.01);
Abstract

Disclosed herein is a method for measuring a position. The method for measuring a position includes: determining a GPS satellite visible area and a GPS satellite invisible area depending on whether or not an area is an area in which a predetermined number or more of GPS satellites are observable; measuring a position of a moving object on the basis of a first position measuring scheme using GPS satellites in the case in which the moving object enters the GPS satellite visible area; and measuring the position of the moving object on the basis of at least one of the first position measuring scheme and a second position measuring scheme other than the first position measuring scheme in the case in which the moving object enters the GPS satellite invisible area.


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