The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2020

Filed:

Sep. 10, 2014
Applicant:

Denka Seiken Co., Ltd., Tokyo, JP;

Inventors:

Yuki Shinohara, Gosen, JP;

Takashi Miyazawa, Gosen, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/569 (2006.01);
U.S. Cl.
CPC ...
G01N 33/56983 (2013.01); G01N 2333/11 (2013.01);
Abstract

Means for enabling an immunoassay with a sufficient sensitivity in an immunoassay for measuring influenza virus in a sample using influenza virus M1 protein as an antigen is provided. A sample processing method in an immunoassay for influenza virus, which method comprises, in an immunoassay for influenza virus using an antibody which undergoes antigen-antibody reaction with influenza virus matrix 1 protein, or an antigen-binding fragment thereof, bringing a sample containing influenza virus into contact with a sample processing liquid containing a surfactant having at least one group selected from the group consisting of palmityl, stearyl, and oleyl, is provided.


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