The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2020
Filed:
Nov. 23, 2016
GM Global Technology Operations Llc, Detroit, MI (US);
Alan L. Browne, Grosse Pointe, MI (US);
Nancy L. Johnson, Northville, MI (US);
Paul W. Alexander, Ypsilanti, MI (US);
Geoffrey P. McKnight, Los Angeles, CA (US);
Guillermo A. Herrera, Winnetka, CA (US);
Christopher B. Churchill, Ventura, CA (US);
Andrew C. Keefe, Encino, CA (US);
Xiujie Gao, Troy, MI (US);
GM Global Technology Operations LLC, Detroit, MI (US);
Abstract
A method of testing a SMA element includes connecting the SMA element to a validation tool, and applying an electrical current to the SMA element over a test cycle. A resistance of the SMA element during the test cycle is measured, while the electrical current is being applied. The measured resistance of the SMA element during the test cycle is correlated to an estimated strain value of the SMA element during the test cycle. A temperature of the SMA element during the test cycle is estimated. A stress in the SMA element during the test cycle is estimated from a stress predicting grid, using the estimated strain value and the estimated temperature of the SMA element during the test cycle. The proper functionality of the SMA element may be determined based on the estimated stress in the SMA element.