The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2020
Filed:
May. 17, 2018
Jasco Corporation, Tokyo, JP;
JASCO Corporation, Tokyo, JP;
Abstract
To provide a total reflection measurement device that can improve a light utilization rate more than a Cassegrain type objective mirror, is capable of total reflection measurement at low magnification, and can maintain compatibility with a conventional objective mirror. The device () includes: a pair of plane mirrors () disposed on a central axis (P); a pair of intermediate mirrors () opposing to the plane mirrors (), respectively; a pair of ellipsoidal mirrors () opposing to the intermediate mirrors (), respectively; and an ATR crystal () provided at a position nearer to the sample side than the pair of plane mirrors () on the central axis (P). The ellipsoidal mirrors () are provided so that each one focal position (C) formed by the intermediate mirror () and the plane mirror () are at same position on the central axis (P), and each another focal position (C) formed by only the intermediate mirror () are also at same position on the central axis (P). Further, the another focal position (C) coincides with a boundary surface between the ATR crystal () and the sample.