The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2020
Filed:
Nov. 10, 2018
Bertec Limited, Edinburgh, GB;
Necip Berme, Worthington, OH (US);
Sasan Ghassab, Columbus, OH (US);
Jan Jakub Ober, Columbus, OH (US);
Bertec Limited, Edinburgh, GB;
Abstract
A force measurement system is disclosed herein. The force measurement system includes a force measurement assembly and a data processing device operatively coupled to the force measurement assembly. In one or more embodiments, the data processing device is configured to reference a stored global calibration matrix for the force measurement assembly, to determine a location of an applied load on the surface of the force measurement assembly using the stored global calibration matrix, to assign the applied load to one or more of a plurality of different load regions based upon the location of the applied load, and to compute one or more output forces or moments of the applied load using stored local calibration information for the one or more of the plurality of different load regions. A method of calibrating a force measurement system is also disclosed herein.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile