The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2020
Filed:
May. 14, 2014
Applicant:
National Institute of Advanced Industrial Science and Technology, Tokyo, JP;
Inventors:
Masakatsu Kourogi, Tsukuba, JP;
Takeshi Kurata, Tsukuba, JP;
Tomoya Ishikawa, Tsukuba, JP;
Takashi Okuma, Tsukuba, JP;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 25/00 (2006.01); G01C 21/12 (2006.01); G01P 21/00 (2006.01); G01C 21/16 (2006.01);
U.S. Cl.
CPC ...
G01C 21/12 (2013.01); G01C 21/16 (2013.01); G01C 25/005 (2013.01); G01P 21/00 (2013.01);
Abstract
An angle offset judging device () includes: an azimuth histogram generating section () for obtaining an appearance frequency of estimated azimuths; and an evaluating section () for making an evaluation of whether or not the appearance frequency thus obtained shows a tendency which is observed in a case where an azimuth is properly estimated under a binding condition concerning an advancing direction of a movement of a moving body.