The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2020

Filed:

Sep. 06, 2017
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Akihiro Taya, Yokohama, JP;

Masahiro Terada, Hadano, JP;

Hidetaka Kawamura, Yokohama, JP;

Yohei Masada, Tokyo, JP;

Masanobu Ootsuka, Tokyo, JP;

Takaharu Aotani, Tokyo, JP;

Yutaka Yoshimasa, Yokohama, JP;

Shoji Koike, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 2/21 (2006.01); B41J 2/04 (2006.01); C09D 11/322 (2014.01); C09D 11/38 (2014.01); C09D 11/40 (2014.01); C09D 11/102 (2014.01); C09D 11/107 (2014.01);
U.S. Cl.
CPC ...
B41J 2/2107 (2013.01); B41J 2/04 (2013.01); C09D 11/102 (2013.01); C09D 11/107 (2013.01); C09D 11/322 (2013.01); C09D 11/38 (2013.01); C09D 11/40 (2013.01);
Abstract

There is provided an image recording method including applying a first ink and a second ink, each of which contains a surfactant and the like, to a recording medium. Critical micelle concentration c1 (mass %) of the surfactant and concentration c2 (mass %) of the surfactant in each ink satisfy a relationship of 'c1×2≤c2'; an HLB value of the surfactant is smaller than 13; content V(mass %) of the surfactant in the first ink is larger than content V(mass %) of the surfactant in the second ink.


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