The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2020
Filed:
Jul. 10, 2017
Koenig & Bauer Ag, Würzburg, DE;
David Engelhardt, Georgsmarienhütte, DE;
Harald Willeke, Paderborn, DE;
Koenig & Bauer AG, Wurzburg, DE;
Abstract
An inspection system has a plurality of detection regions. The plurality of these detection regions of the inspection system are arranged to jointly inspect a printed sheet which has a plurality of printed regions. A first detection region is arranged to inspect a first printed region of the printed sheet and a second detection region is arranged to inspect a second printed region of the same printed sheet. A first measurement technology sensitivity is set for the first detection region and a second measurement technology sensitivity is set for the second detection region in the inspection system. The first measurement technology sensitivity and the second measurement technology sensitivity are set to be different from one another. The first measurement technology sensitivity and the second measurement technology sensitivity are set in each case either manually, by the use of an operating element, or automatically by the use of a program.