The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2020

Filed:

May. 16, 2017
Applicant:

Institute of Nuclear Energy Research, Atomic Energy Council, Executive Yuan, R.o.c., Taoyuan, TW;

Inventors:

Meei-Ling Jan, Taoyuan, TW;

Sheng-Pin Tseng, Taoyuan, TW;

Chia-Hao Chang, Taoyuan, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H05G 1/10 (2006.01); G01B 15/02 (2006.01); H05G 1/64 (2006.01); A61B 6/00 (2006.01); G01B 11/06 (2006.01); G01B 11/22 (2006.01); G01B 17/02 (2006.01);
U.S. Cl.
CPC ...
A61B 6/542 (2013.01); A61B 6/405 (2013.01); G01B 11/06 (2013.01); G01B 11/22 (2013.01); G01B 17/02 (2013.01);
Abstract

The invention provides an automatic exposure control method for a digital X-ray imaging device. The automatic exposure control method for a digital X-ray imaging device includes the following the steps. First, a parameter database is provided before imaging scan. A depth information is generated, wherein the depth information by a depth sensor detect the thickness of a region of interest of an object. Imaging exposure parameters, mAs and kV, are estimated according to the depth information and the parameter database. Then, X-ray imaging is performed according to the imaging exposure parameters estimated by the method described in this application. In addition, an automatic exposure control system for a digital X-ray imaging device is also provided.


Find Patent Forward Citations

Loading…