The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2019
Filed:
Jan. 14, 2015
Mehdi Mohseni, Menlo Park, CA (US);
Ming-yang Chen, Stanford, CA (US);
Adaptive Spectrum and Signal Alignment, Inc., Redwood City, CA (US);
Mehdi Mohseni, Menlo Park, CA (US);
Ming-Yang Chen, Stanford, CA (US);
ASSIA SPE, LLC, Wilmington, DE (US);
Abstract
In accordance with embodiments disclosed herein, there are provided apparatus, systems and methods for implementing DSL line fault determination and localization via SELT, DELT, and MELT diagnostics. For example, such a system or computer implemented method may include means for: receiving Metallic Loop/Line Testing (MELT) test output from applying a MELT test to a DSL line; receiving Dual-End Line Testing (DELT) test output from applying a DELT test to the DSL line; receiving Single-Ended Loop Testing (SELT) test output from applying a SELT test to the DSL line; determining one or more faults are present on the DSL line by comparing the MELT test output, the DELT test output, and the SELT test output; and localizing the one or more determined faults by comparing the MELT test output, the DELT test output, and the SELT test output. Other related embodiments are disclosed.