The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2019

Filed:

Jan. 08, 2018
Applicant:

Mellanox Technologies Denmark Aps, Roskilde, DK;

Inventors:

Thorkild Franck, Roskilde, DK;

Allan Green-Petersen, Smoerum, DK;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 27/02 (2006.01); H01L 21/66 (2006.01); H01L 23/00 (2006.01); H01L 23/528 (2006.01); H01L 23/66 (2006.01); G01R 31/00 (2006.01); G01R 31/28 (2006.01); H02H 9/04 (2006.01);
U.S. Cl.
CPC ...
H01L 27/0248 (2013.01); G01R 31/002 (2013.01); G01R 31/2851 (2013.01); H01L 22/32 (2013.01); H01L 23/5286 (2013.01); H01L 23/66 (2013.01); H01L 24/05 (2013.01); H02H 9/04 (2013.01); H01L 2223/6638 (2013.01); H01L 2224/04042 (2013.01); H01L 2224/05025 (2013.01);
Abstract

A circuit providing electrostatic discharge (ESD) protection and a method and an apparatus for testing ESD protection on an integrated circuit are described. The circuit includes a first ESD protection circuit and a test pad and a second ESD protection circuit and a second pad for the application, not probed during manufacturing of the integrated circuit. In some examples, the method includes providing a first, second, third, and fourth test current to the circuit providing ESD protection, measuring a first second, third, and fourth voltage drop across the circuit, and determining an operating condition for the first ESD protection circuit and the test pad and the second ESD protection circuit and the second bond pad based on expected values of the first voltage drop, the second voltage drop, the third voltage drop, and the fourth voltage drop.


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