Column-dependent positive voltage boost for memory cell supply voltage

Abstract

Disclosed is a chip with a memory array and at least one positive voltage boost circuit, which provides positive voltage boost pulses to the sources of pull-up transistors in the memory cells of the array during write operations to store data values in those memory cells and, more specifically, provides positive voltage boost pulses substantially concurrently with wordline deactivation during the write operations to ensure that the data is stored. Application of such pulses to different columns can be performed using different positive voltage boost circuits to minimize power consumption. Also disclosed are a memory array operating method that employs a positive voltage boost circuit and a chip manufacturing method, wherein post-manufacture testing is performed to identify chips having memory arrays that would benefit from positive voltage boost pulses and positive voltage boost circuits are attached to those identified chips and operably connected to the memory arrays.