The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2019
Filed:
Aug. 03, 2016
Sharp Kabushiki Kaisha, Sakai, Osaka, JP;
Noritaka Kishi, Sakai, JP;
Hiroyuki Furukawa, Sakai, JP;
Katsuya Otoi, Sakai, JP;
Kazuyoshi Yoshiyama, Sakai, JP;
Tamotsu Sakai, Sakai, JP;
Naoko Goto, Sakai, JP;
Noboru Noguchi, Sakai, JP;
SHARP KABUSHIKI KAISHA, Sakai, JP;
Abstract
In a data line drive/current measurement circuit, m measurement units are disposed in a plurality of semiconductor chips such that the m measurement units are distributed among the plurality of semiconductor chips. A display apparatus includes transistors such that one transistor is provided for two adjacent semiconductor chips. Inter-chip correction data indicating a variation among the semiconductor chips in terms of characteristics of elements in the measurement units is determined based on a result of a current measurement performed for the same transistor using measurement units disposed in different semiconductor chips. The inter-chip correction data is stored in a storage unit and is used in correcting an image signal. The inter-chip correction data may be determined based on a result of measuring a current flowing through a common cathode of organic EL elements for each semiconductor chip. Thus, a variation in the characteristic of the element among the semiconductor chips is compensated for and high image quality is achieved in displaying.