The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2019
Filed:
Feb. 21, 2018
Adobe Inc., San Jose, CA (US);
Emiliano Gambaretto, San Francisco, CA (US);
Vladimir Kim, Seattle, WA (US);
Qingnan Zhou, San Francisco, CA (US);
Mehmet Ersin Yumer, San Jose, CA (US);
Adobe Inc., San Jose, CA (US);
Abstract
Certain embodiments involve refining local parameterizations that apply two-dimensional ('2D') images to three-dimensional ('3D') models. For instance, a particular parameterization-initialization process is select based on one or more features of a target mesh region. An initial local parameterization for a 2D image is generated from this parameterization-initialization process. A quality metric for the initial local parameterization is computed, and the local parameterization is modified to improve the quality metric. The 3D model is modified by applying image points from the 2D image to the target mesh region in accordance with the modified local parameterization.