The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2019
Filed:
Oct. 31, 2017
Hewlett Packard Enterprise Development Lp, Houston, TX (US);
David Adamson, San Mateo, CA (US);
Roderick Bagg, San Jose, CA (US);
Hewlett Packard Enterprise Development LP, Houston, TX (US);
Abstract
A flaw classifier model classifies a computing system as one which contains or does not contain one or more flaws that affect a performance of the computing system. Inputs to the flaw classifier model may include an actual utilization of a resource of the computing system and an expected utilization of the resource of the computing system. The expected utilization of the resource may be determined by an expected resource utilization model. Inputs to the expected resource utilization model may include workload description parameter values and hardware description parameter values.