The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2019

Filed:

Feb. 28, 2018
Applicant:

Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;

Inventors:

Ripon K. Saha, Santa Clara, CA (US);

Mukul R. Prasad, San Jose, CA (US);

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 8/75 (2018.01); G06F 8/33 (2018.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06F 8/75 (2013.01); G06F 8/33 (2013.01); G06K 9/6215 (2013.01);
Abstract

The disclosed method may include accessing features including feature information of one or more candidate target projects and of a subject project, in which the candidate target projects and the subject project are software programs. The method may include determining a similarity score between the feature information of each of the candidate target projects and the feature information of the subject project, in which a similarity score is determined for each feature of each of the candidate target projects. The method may include aggregating the similarity scores of the feature information of each feature in the candidate target projects to create an aggregate similarity score for each of the candidate target projects and generate a set of similar target projects. The method may include modifying the subject project by implementing recommended code, based on the similar target projects, in the subject project to repair a defect.


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