The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2019

Filed:

Jul. 28, 2016
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Kwan Yin Lau, Hong Kong, CN;

Chin Hsiu Chuang, Guangzhou, CN;

Adrian Napoles, Cupertino, CA (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 29/10 (2006.01); G01R 1/067 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 29/10 (2013.01); G01R 1/06772 (2013.01); G01R 1/06722 (2013.01); G01R 31/2822 (2013.01);
Abstract

A groundless radio frequency (RF) test probe comprises a first connector to receive a signal from a system under test and a second connector to present the signal as an output. The probe further comprises an antenna array coupled between the first connector and the second connector, the antenna array to couple the signal from the first connector to the second connector, wherein the antenna pair is impedance matched with the system under test. The probe does not have a physical ground connection with the system under test.


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