The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2019
Filed:
Jul. 13, 2017
Applicant:
Korea Sensor Lab Co., Ltd., Daejeon, KR;
Inventor:
Soo Min Lee, Daejeon, KR;
Assignee:
KOREA SENSOR LAB CO., LTD., Daejeon, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/08 (2006.01); G01R 29/26 (2006.01); G01R 23/20 (2006.01); G10K 11/16 (2006.01);
U.S. Cl.
CPC ...
G01R 23/20 (2013.01); G01R 29/0821 (2013.01); G01R 29/0835 (2013.01); G01R 29/26 (2013.01); G10K 11/16 (2013.01);
Abstract
The present invention relates to an apparatus for measuring low frequency noise having shielding characteristics, and enhance the accuracy of measurement of low frequency noise of a sample by blocking the flow of electromagnetic waves in the gap between the chamber and the door.
Lee, Soo. (2019). Low frequency noise measuring apparatus with electromagnetic shielding characteristics (U.S. Patent No. 10520532). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10520532
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile