The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2019
Filed:
Mar. 13, 2015
National Cheng Kung University, Tainan, TW;
National Cheng Kung University Hospital, Tainan, TW;
Meng-Ru Shen, Tainan, TW;
Lian-Yun Chang, Tainan, TW;
Yuan-Ting Sun, Tainan, TW;
Jang-Yang Chang, Tainan, TW;
NATIONAL CHENG KUNG UNIVERSITY, Tainan, TW;
NATIONAL CHENG KUNG UNIVERSITY HOSPITAL, Tainan, TW;
Abstract
A method for assessment of neural function by establishing an analysis module is revealed. The first step of the method is to capture images of the cultured cells with a plurality of fluorescence labeling by a fluorescence microscopy system for image analysis. The cultured cells include neurons and non-neuronal cells. Then select neurons with neurites having fluorescence labeling and exclude non-neuronal cells according to an area and a fluorescence intensity of nucleus. Also calculate an area of the neuronal cell body, a length of the neurites and a number of processes and branches to verify outgrowth of the neurites of the neurons. Next calculate a number of synaptic puncta having fluorescence labeling on the area of the neurites having fluorescence labeling defined in Step 2 to verify formation of the synaptic puncta of the neurons for assessment of neural function.