The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2019
Filed:
Jul. 16, 2018
Applicant:
Avl Test Systems, Inc., Plymouth, MI (US);
Inventor:
Frank Berghof, Graz, AT;
Assignee:
AVL TEST SYSTEMS, INC., Plymouth, MI (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/00 (2006.01); G01D 3/02 (2006.01); G01D 18/00 (2006.01);
U.S. Cl.
CPC ...
G01N 33/0006 (2013.01); G01D 3/022 (2013.01); G01D 18/008 (2013.01);
Abstract
Disclosed is a method of correcting a response of an instrument. The method includes determining an inverse convolution function, the inverse convolution function being in the time domain. A response of an instrument to an exhaust sample is recorded as a function of time. The recorded response is then convolved with the inverse convolution function, the result being a convolution corrected instrument response.