The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2019

Filed:

Jan. 05, 2016
Applicant:

Agamatrix, Inc., Salem, NH (US);

Inventors:

Charles Boiteau, Carlisle, MA (US);

Martin Forest, Nashua, NH (US);

Sridhar Iyengar, Salem, NH (US);

Baoguo Wei, Salem, NH (US);

Assignee:

AgaMatrix, Inc., Salem, NH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/30 (2006.01); G01N 33/487 (2006.01); G01N 27/327 (2006.01);
U.S. Cl.
CPC ...
G01N 27/307 (2013.01); G01N 27/3272 (2013.01); G01N 27/3274 (2013.01); G01N 33/48771 (2013.01);
Abstract

The present invention provides a method and apparatus for creating test strips that may be identified based on differences in electrical conduction or resistance between contact point on the test strip. This is achieved by creating a base test strip with contact points that may be connected to other contact points by an electrical connection. These base test strips may be modified to create a difference in electrical conductivity between contact points, or a contact point may be eliminated. This modification can be used to distinguish different types of test strips based on electrical signature. Additionally, the base test strip may be created such that multiple modifications are possible to distinguish numerous characteristics of test strips.


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