The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2019
Filed:
Jun. 03, 2016
Tokyo Metropolitan Industrial Technology Research Institute, Tokyo, JP;
Abstract
Provided are an image acquisition device and an image acquisition method capable of acquiring the internal and external contours of a measured object with a high degree of accuracy. An image acquisition deviceincludes: a first X-ray sourcethat applies X-rays having a first focal point size; a first detectorthat detects X-rays applied from the first X-ray sourceand having passed through a measured object O; a first image generation meansthat generates a first X-ray CT image on the basis of the X-rays detected by the first detector; a second X-ray sourcethat applies X-rays having a second focal point size smaller than the first focal point size; a second detectorthat detects X-rays applied from the second X-ray source and having passed through the measured object O; a second image generation meansthat generates a second X-ray CT image on the basis of the X-rays detected by the second detector; and an image correction meansthat corrects the first X-ray CT image generated by the first image generation meanson the basis of the second X-ray CT image generated by the second image generation means
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