The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2019
Filed:
Mar. 16, 2016
Katholieke Universiteit Leuven, Leuven, BE;
Universiteit Gent, Ghent, BE;
Universiteit Antwerpen, Antwerp, BE;
Mattias Van Dael, Brussels, BE;
Pieter Verboven, Herent, BE;
Bart Nicolaï, Heusden-Zolder, BE;
Jelle Dhaene, Ghent, BE;
Luc Van Hoorebeke, Ghent, BE;
Jan Sijbers, Duffel, BE;
KATHOLIEKE UNIVERSITEIT LEUVEN, Leuven, BE;
UNIVERSITEIT GENT, Ghent, BE;
UNIVERSITEIT ANTWERPEN, Antwerp, BE;
Abstract
A non-destructive inspection method for inline inspection of an object comprises moving an object in between a radiation source and an image detector and through a three-dimensional scanner field of view, imaging the object using the image detector to obtain a projection radiograph of an internal structure of the object, scanning an exterior surface of the object using the 3D scanner, fitting a shape model of the object to a point cloud provided by the 3D scanner to obtain a surface model of the exterior surface, creating a solid model of the surface model by taking a grey value distribution of a reference object into account, simulating a reference radiograph from the solid model and comparing the reference and projection radiographs to detect internal deviations of the object.