The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2019

Filed:

Feb. 04, 2019
Applicant:

Malvern Panalytical Limited, Malvern, Worcestershire, GB;

Inventors:

Jason Corbett, Malvern, GB;

Alex Malm, Malvern, GB;

Assignee:

Malvern Panalytical Limited, Malvern, Worcestershire, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/02 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 15/0211 (2013.01); G01N 2015/0038 (2013.01); G01N 2015/0053 (2013.01); G01N 2015/0222 (2013.01);
Abstract

Disclosed herein is a method of characterizing particles in a sample. The method comprises illuminating the sample in a sample cell with a light beam, so as to produce scattered light by the interaction of the light beam with the sample; obtaining a time series of measurements of the scattered light from a single detector; determining, from the time series of measurements from the single detector, which measurements were taken at times when a large particle was contributing to the scattered light; determining a particle size distribution, including correcting for light scattered by the large particle.


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