The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2019
Filed:
Dec. 22, 2017
Carl Zeiss Ag, Oberkochen, DE;
Carl Zeiss Vision International Gmbh, Aalen, DE;
Carsten Glasenapp, Oberkochen, DE;
Matthias Hornauer, Lauchheim-Hülen, DE;
Carl Zeiss AG, Oberkochen, DE;
Carl Zeiss Vision International GmbH, Aalen, DE;
Abstract
An apparatus and a method for measuring individual data of spectacles arranged in a measurement position are disclosed. The spectacles have a left and/or a right spectacle lens. The apparatus has a display for displaying a test structure. The apparatus contains an image capture device for capturing the test structure with an imaging beam path which passing through the left spectacle lens and/or the right spectacle lens of the spectacles. Further, the apparatus includes a computer unit with a computer program for determining a refractive power distribution for at least a section of the left spectacle lens and/or the right spectacle lens from the image of the test structure captured by the image capture device and a known spatial orientation of the display relative to the image capture device. To measure individual data of spectacles, the spectacles are arranged in a measurement position.