The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2019

Filed:

Oct. 18, 2017
Applicant:

Taiyo Yuden Co., Ltd., Tokyo, JP;

Inventors:

Fuyuki Miyazawa, Tokyo, JP;

Katsuhiro Oyama, Tokyo, JP;

Isao Matsuda, Tokyo, JP;

Yasuhito Hagiwara, Tokyo, JP;

Takaki Hamamoto, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 1/25 (2006.01); G01L 1/22 (2006.01); G01L 1/04 (2006.01); G01L 1/06 (2006.01); G01L 1/24 (2006.01);
U.S. Cl.
CPC ...
G01L 1/22 (2013.01); G01L 1/04 (2013.01); G01L 1/06 (2013.01); G01L 1/2206 (2013.01); G01L 1/24 (2013.01); G01L 1/25 (2013.01);
Abstract

In one aspect, a load cell includes an elastic body, first optical unit, second optical unit, detector, and computation unit. The first optical unit has a light source, a first diffraction grating on which light from the light source is incident, and a light-receiving unit. The first optical unit is fixed to a first end portion of the elastic body and arranged within a hollow portion of the elastic body. The second optical unit has a second diffraction grating on which diffracted light from the first diffraction grating is incident to generate interference light. The second optical unit is fixed to a second end portion of the elastic body and arranged within the hollow portion. The detector detects the interference light. The computation unit computes a relative displacement amount of the second diffraction grating relative to the first diffraction grating on the basis of a signal obtained by the detector.


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