The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2019
Filed:
Jul. 31, 2018
Northrop Grumman Systems Corporation, Falls Church, VA (US);
Michael L. Dupuis, Culver City, CA (US);
Daniel K. Smith, Redondo Beach, CA (US);
Daniel Lam, Monterey Park, CA (US);
Christopher J. Lieto, Agoura Hills, CA (US);
Michael E. Farey, Palmdale, CA (US);
Joshua E. Rothenberg, Los Angeles, CA (US);
Northrop Grumman Systems Corporation, Falls Church, VA (US);
Abstract
A beam quality measurement system for determining beam quality of a high power laser beam from a laser system by power-in-the-bucket (PIB) measurements in a laboratory environment. The system includes a beam compressor assembly for compressing the diameter of the laser beam, and a diagnostic bench assembly that receives the reduced diameter low power beam from the beam compressor assembly. The bench assembly includes a pinhole array positioned at a focal plane of a lens and that includes a plurality of different sized pinholes and a translation stage for moving the pinhole array. The bench assembly also includes a power meter that receives the focused beam after it has passed through a pinhole in the pinhole array, where the power meter generates a signal that causes the stage to move the pinhole array to position another pinhole when the power meter identifies a maximum power received from one pinhole.