The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2019

Filed:

May. 04, 2018
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventor:

Yamato Mishima, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
F16C 17/24 (2006.01); G01M 13/005 (2019.01); F16J 15/3296 (2016.01); F16J 15/00 (2006.01); F16C 17/02 (2006.01); G01N 3/56 (2006.01); G01M 3/00 (2006.01); G01M 13/00 (2019.01); F01D 21/12 (2006.01); F01D 25/18 (2006.01);
U.S. Cl.
CPC ...
F16C 17/246 (2013.01); F16C 17/02 (2013.01); F16J 15/00 (2013.01); F16J 15/3296 (2013.01); G01M 13/005 (2013.01); G01N 3/56 (2013.01); F01D 21/12 (2013.01); F01D 25/186 (2013.01); G01M 3/002 (2013.01); G01M 13/00 (2013.01);
Abstract

An abnormal wearing detection device for seal members for detecting abnormal wearing of a seal member that slides in relation to a circumferential surface of a rotating member to seal the circumferential surface of the rotating member, includes: at least two measuring units among a load ratio measuring unit that measures a load ratio during rotation of the rotating member, a temperature measuring unit that measures the temperature of the seal member, and a gas concentration measuring unit that measures a concentration of a gas emitted from the seal member; and a determining unit that determines that abnormal wearing has occurred when it is detected that at least two measurement values measured by the at least two measuring units fail below a first reference value.


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