The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2019
Filed:
Apr. 02, 2015
Applicant:
Apocell, Inc., Houston, TX (US);
Inventors:
Anoop Menachery, Abu Dhabi, AE;
Ronald Pethig, Anglesey, GB;
Assignee:
APOCELL, INC., Houston, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/447 (2006.01); B03C 5/00 (2006.01); B03C 5/02 (2006.01); G01N 33/487 (2006.01);
U.S. Cl.
CPC ...
B03C 5/005 (2013.01); B03C 5/026 (2013.01); G01N 27/44713 (2013.01); G01N 27/44721 (2013.01); G01N 33/48707 (2013.01); B03C 2201/26 (2013.01);
Abstract
The present invention provides a new method for accurately identifying DEP cross-over frequencies of one or more particles in a sample, and quickly and efficiently conveying that information to assist in the separation, e.g., DEP separation, or analysis of the one of more particles under examination or investigation. The present invention also provides an apparatus and method for monitoring the dielectrophoretic response of one or more particles and determining the DEP cross-over frequency of particles of interest.