The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2019

Filed:

Jul. 06, 2016
Applicant:

Carl Zeiss Meditec Ag, Jena, DE;

Inventors:

Gerhard Krampert, Pleasanton, CA (US);

Johannes Kindt, Weimar, DE;

Daniel Bublitz, Rausdorf, DE;

Robert Pomraenke, Jena, DE;

Martin Kühner, Bad Klosterlausnitz, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61F 9/008 (2006.01); A61B 3/10 (2006.01); A61B 3/14 (2006.01);
U.S. Cl.
CPC ...
A61F 9/00834 (2013.01); A61B 3/102 (2013.01); A61B 3/1005 (2013.01); A61B 3/1025 (2013.01); A61B 3/14 (2013.01); A61F 9/0084 (2013.01); A61F 9/00827 (2013.01); A61F 2009/0087 (2013.01); A61F 2009/00844 (2013.01); A61F 2009/00851 (2013.01); A61F 2009/00887 (2013.01);
Abstract

Systems and methods for localizing intraocular lens and/or existing refractive index patterns, to laser write-patterns, and to refractive index patterns in order to modify the refractive index by application of femtosecond laser pulses. OCT-based confocal detection and sectional image systems are provided for localization purposes, the systems being particularly suitable for the detection of phase patterns in addition to the localization of the IOL. With respect to laser write-patterns, the modification of existing refractive index patterns in the IOL is carried out by destroying existing structures or supplementing existing refractive index patterns.


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