The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2019
Filed:
Mar. 30, 2016
Applicant:
Koninklijke Philips N.v., Eindhoven, NL;
Inventors:
Alphonsus Tarcisius Jozef Maria Schipper, Stramproy, NL;
Koen Geenen, Gilze, NL;
Assignee:
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/1455 (2006.01); A61B 5/00 (2006.01); A61B 5/024 (2006.01); A61B 5/026 (2006.01); A61B 5/0205 (2006.01);
U.S. Cl.
CPC ...
A61B 5/14551 (2013.01); A61B 5/0205 (2013.01); A61B 5/0261 (2013.01); A61B 5/02416 (2013.01); A61B 5/7203 (2013.01); A61B 5/7225 (2013.01); A61B 5/7242 (2013.01);
Abstract
An optical analysis system and method is provided in which a sample is analyzed using a light source. An optical sensor signal is processed using a first signal processing circuit and an electrical signal, which is representative of a drive signal applied to the light source, is processed using a second signal processing circuit. The sensor signal is further processed to improve the signal to noise ratio using the processed electrical signal as a reference.