The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2019
Filed:
Nov. 27, 2018
Konica Minolta, Inc., Chiyoda-ku, Tokyo, JP;
Kenji Yamanaka, Hachioji, JP;
Makoto Oki, Hino, JP;
KONICA MINOLTA, INC., Tokyo, JP;
Abstract
There is provided an inspection apparatus that inspects a printed material for a smudge, in accordance with an inspection image formed by reading a printed material, a print image being formed on the printed material, the inspection apparatus including: a hardware processor that: performs position adjustment between a reference image serving as an inspection standard for the print image, and the inspection image; detects a region presumed to be a smudge on the printed material as a smudge candidate region, in accordance with a difference image generated from the reference image and the inspection image after the position adjustment; and determines whether the smudge candidate region is a false smudge candidate region resulting from a positional shift of an object in the print image, in accordance with the smudge candidate region detected by the hardware processor and difference data characteristics of the difference image.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile