The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2019

Filed:

Mar. 13, 2018
Applicant:

Thermo Finnigan Llc, San Jose, CA (US);

Inventors:

George B. Guckenberger, Austin, TX (US);

Scott T. Quarmby, Round Rock, TX (US);

John G. Voss, Round Rock, TX (US);

Michael B. Young, Austin, TX (US);

Assignee:

THERMO FINNIGAN LLC, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); H01J 49/02 (2006.01); H01J 49/14 (2006.01); H01J 49/06 (2006.01); H01J 49/42 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0009 (2013.01); H01J 49/025 (2013.01); H01J 49/147 (2013.01); H01J 49/06 (2013.01); H01J 49/4205 (2013.01);
Abstract

A method of operating a mass spectrometer comprising: detecting a first ion species using a first gain setting of a detector or a first emission current for a first mass-to-charge range; detecting a second ion species using a second gain setting of the detector or a second emission current for a second mass-to-charge range; and using the detected first and second ion species to calibrate the mass range of a mass analyzer of the mass spectrometer, to tune the resolution of the mass analyzer, or to tune an ion optic of the mass spectrometer.


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