The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2019

Filed:

Dec. 29, 2015
Applicant:

Industrial Technology Research Institute, Chu-Tung, Hsinchu, TW;

Inventors:

Chung-Wei Lin, Zhubei, TW;

Te-Ming Chen, Taipei, TW;

Chuang-Hua Chueh, Taipei, TW;

Sen-Chia Chang, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16H 50/30 (2018.01); G16H 40/63 (2018.01);
U.S. Cl.
CPC ...
G16H 50/30 (2018.01); G16H 40/63 (2018.01);
Abstract

A health assessment method and a health assessment device of a workpiece processing apparatus are disclosed. The health assessment method includes the following steps. Acquire a first sensing data related to the workpiece processing apparatus at an operation stage of the workpiece processing apparatus. Set the first sensing data as a substitution of a first transform model to acquire a virtual workpiece quality. Set the virtual workpiece quality as a substitution of a second transform model to acquire a first virtual apparatus health index.


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