The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2019
Filed:
Apr. 17, 2019
Texas Instruments Incorporated, Dallas, TX (US);
Anish Reghunath, Plano, TX (US);
Hetul Sanghvi, Richardson, TX (US);
Michael Lachmayr, Boxford, MA (US);
Mihir Mody, Karnataka, IN;
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Abstract
Systems and methods for performing Census Transforms that includes an input from an image, with a support window created within the image, and a kernel within the support window. The Census Transform calculations and comparisons are performed within the kernel windows. A new Census Transform is disclosed which always inverts a previously made comparison. This new approach can be demonstrated to be equivalent to, applying the original Census Transform, on a pre-processed input kernel, where the pre-processing step adds a fractional position index to each pixel within the N×N kernel. The fractional positional index ensures that no two pixels are equal to one another, and thereby makes the Original Census algorithm on pre-processed kernel same as the new Census algorithm on original kernel. The hardware design for this new Census Transform kernel allows for an always invert of previous comparison system resulting in reduced hardware and power consumption.