The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2019

Filed:

Feb. 26, 2015
Applicant:

Mitsubishi Electric Research Laboratories, Inc., Cambridge, MA (US);

Inventors:

Michael J Jones, Belmont, MA (US);

Tim Marks, Newton, MA (US);

Chavdar Papazov, Munich, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/73 (2017.01); G06K 9/46 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00221 (2013.01); G06K 9/00248 (2013.01); G06K 9/4628 (2013.01); G06K 9/6271 (2013.01); G06T 7/75 (2017.01); G06T 2207/10028 (2013.01); G06T 2207/30201 (2013.01);
Abstract

A method and system determine a three-dimensional (3D) pose of an object and 3D locations of landmark points of the object by first obtaining a 3D point cloud of the object. 3D surface patches are extracted from the 3D point cloud, and a parametric model is fitted to each 3D surface patch to determine a set of descriptors. A set of correspondences between the set of descriptors and a set of descriptors of patches extracted from 3D point clouds of objects from the same object class with known 3D poses and known 3D locations of landmark points is determined. Then, the 3D pose of the object and 3D locations of the landmark points of the object are estimated from the set of correspondences.


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