The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2019

Filed:

Feb. 22, 2019
Applicant:

Keyence Corporation, Osaka, JP;

Inventors:

Hidezumi Nagata, Osaka, JP;

Taichi Tajika, Osaka, JP;

Hiroomi Ohori, Osaka, JP;

Taiga Nomi, Osaka, JP;

Assignee:

Keyence Corporation, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 15/00 (2006.01); G06K 7/14 (2006.01); G06K 7/10 (2006.01);
U.S. Cl.
CPC ...
G06K 7/1417 (2013.01); G06K 7/10722 (2013.01); G06K 7/10752 (2013.01);
Abstract

[Object] To enhance accuracy at the time of setting with consideration of a cell size of a code when an exposure time is automatically set. [Means to solve the problems] An upper limit of an exposure time of an imaging part as a restriction condition for reading a code attached to a workpiece is calculated based on a moving speed of the workpiece, which is inputted by an input part, and a cell size, which is calculated by a cell size calculation part. An exposure time of the imaging part is set within the restriction condition by analyzing a plurality of images, which includes a code and is obtained by taking images multiple times by changing the exposure time of the imaging part.


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