The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2019

Filed:

Jul. 31, 2017
Applicant:

Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;

Inventor:

Shigefumi Yamada, Sagamihara, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/32 (2013.01); G06K 9/00 (2006.01); G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
G06F 21/32 (2013.01); G06F 17/18 (2013.01); G06K 9/00926 (2013.01);
Abstract

An evaluation device includes: a memory; and a processor coupled to the memory and the processor configured to execute a process, the process comprising: generating a plurality of sets from a first population of biometric data collected from a plurality of users, a number of biometric data of the plurality of sets being smaller than that of the first population, at least a part of the plurality of sets being different from each other; estimating a probability density distribution of similarity degrees of different people's pairs of each of the plurality of sets; calculating a false acceptance rate with respect to each similarity degree threshold on a basis of the probability density distribution, with respect to each of the plurality of sets; and estimating a combined false acceptance rate from a statistic amount of false acceptance rates of the plurality of sets calculated by the calculating.


Find Patent Forward Citations

Loading…