The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2019
Filed:
Nov. 09, 2017
Cloudera, Inc., Palo Alto, CA (US);
Vikas Singh, San Jose, CA (US);
Sudhanshu Arora, Sunnyvale, CA (US);
Philip Zeyliger, San Francisco, CA (US);
Marcelo Masiero Vanzin, San Francisco, CA (US);
Chang She, San Francisco, CA (US);
Cloudera, Inc., Palo Alto, CA (US);
Abstract
Techniques are disclosed for inferring design-time information based on run-time artifacts generated by services operating in a distributed computing cluster. In an embodiment, a metadata system extracts metadata including run-time artifacts generated by services in a distributed computing cluster while processing a workflow including multiple jobs. The extracted metadata is processed to identify entities and entity relationships which can then be used to generate lineage information. Using the lineage information, the metadata system can infer design-time information associated with the workflow. The inferred design-time information can then be utilized to, for example, recreate the workflow, recreate previous versions of the workflow, optimize the workflow, etc.