The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2019
Filed:
Jul. 22, 2011
James Ausdenmoore, Gurnee, IL (US);
Peter Osella, Chicago, IL (US);
Ralph Taylor, Hawthorne Woods, IL (US);
James Ausdenmoore, Gurnee, IL (US);
Peter Osella, Chicago, IL (US);
Ralph Taylor, Hawthorne Woods, IL (US);
SYSMEX CORPORATION, Hyogo, JP;
Abstract
An analyzer for measuring a sample includes a display, measurement hardware configured to perform a quality control measurement on a vial containing a quality control (QC) sample, and a controller. The controller is in communication with the display and the measurement hardware and is configured to communicate, via the display, instructions to implement a QC measurement on a first vial containing a first QC sample. If a result of the QC measurement is within a pre-determined range the first vial passes the QC measurement. If the result of the QC measurement is not within the pre-determined range the first vial fails the QC measurement. If the first vial fails the QC measurement and if a number of times the first vial fails the QC measurement is less than a predetermined number, the controller is configured to communicate, via the display, instructions to repeat the QC measurement on the first vial.