The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2019
Filed:
Feb. 23, 2018
The Boeing Company, Chicago, IL (US);
Jeong-Beom Ihn, Bellevue, WA (US);
Gary E. Georgeson, Tacoma, WA (US);
William Paul Motzer, Mount Pleasant, SC (US);
The Boeing Company, Chicago, IL (US);
Abstract
Methods and systems may be configured to integrate data from fixed nondestructive inspection sensors positioned on a test specimen and data from laser ultrasound scans of the test specimen, in order to monitor and track damage and stress indications in the test specimen in real-time during mechanical stress testing of the test specimen. Data from the laser ultrasound scans may identify emergent areas of interest within the test specimen that were not predicted by stress analysis, and further allow for reconfiguration of the test plan in view of the emergent areas of interest, without having the stop the test. Laser ultrasound scans may be performed on the entire test specimen, with high-resolution scans being performed on emergent areas of interest. Thus, stress indications, or stress effects, in the test specimen may be measured, identified, and tracked in real-time (e.g., as growth is propagating) in a test specimen undergoing structural tests.