The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2019
Filed:
Aug. 30, 2016
Htc Corporation, Taoyuan, TW;
Chung-Jung Chen, Taoyuan, TW;
Ming-Tien Lin, Taoyuan, TW;
HTC Corporation, Taoyuan, TW;
Abstract
A test strip analyser is provided. The test strip analyser includes a frame, a test control module and an optical system. The test control module is disposed in the frame and includes a test strip carrier of a plurality of test strip carriers and a sample container of a plurality of sample containers. The test strip carrier is disposed on the frame and adapted to hold a test strip. The sample container is adapted to contain a sample. The optical system is disposed above the frame and the test control module and includes a light sensor and controller. The light sensor is configured to capture an image of the test strip. The controller is connected to the light sensor to control the light sensor, and the light sensor feedbacks the image to the controller. In addition, an analysing method using the same is also provided.