The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2019
Filed:
Dec. 13, 2017
Micromeritics Instrument Corporation, Norcross, GA (US);
Preston Hendrix, Lawrenceville, GA (US);
Samuel Varner, Lilburn, GA (US);
Micromeritics Instrument Corporation, Norcross, GA (US);
Abstract
Systems and methods for profiling a material property are provided. A plurality of measurement devices can be configured to measure at least a portion of the material property. A controller including at least one processor can be in communication with one or more of the plurality of measurement devices. At least one measurement device of the plurality of measurement devices can measure at least one segment of the material property, and at least one additional measurement device of the plurality of measurement devices can measure at least one additional segment of the material property. The at least one segment and the at least one additional segment can be combined to provide at least a partial profile of the material property.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile