The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2019
Filed:
Mar. 29, 2013
William David Mawby, Greenville, SC (US);
William David Mawby, Greenville, SC (US);
Compagnie Generale des Etablissements Michelin, Clermont-Ferrand, FR;
Michelin Recherche et Technique, S.A., Granges-Paccot, CH;
Abstract
Systems and methods for improving the uniformity of a tire based on estimated process harmonic magnitudes for one or more process effects are provided. Magnitudes of process harmonics associated with one or more candidate process effects can be determined from the observed magnitudes of one or more harmonics of measured uniformity parameters. The estimated process harmonic magnitude(s) can be determined without requiring phase angle or azimuth information associated with the observed magnitudes. The estimated process harmonic magnitude(s) can be determined by identifying a process harmonic magnitude pattern for identified candidate process effects. A model can be constructed correlating the candidate magnitudes specified by the process harmonic magnitude pattern with observed magnitudes of corresponding harmonics of a measured uniformity waveform. Regression or programming techniques can be used to estimate coefficients associated with candidate magnitude terms in the model.